Faulhaber, Mark Edwin and Smith, Jr., Edmund Haislett. Defect identification with normalizing of gain function in optical-electrical inspection.
Object Details
- General
- U. S. Patent 4,005,281, filed May 14, 1975, and issued January 25, 1977.
- Collection Creator
- Gerber, H. Joseph, 1924-1996
- Gerber Scientific Instrument Company (Hartford, Conn.).
- See more items in
- Gerber Scientific Instrument Company Records
- Gerber Scientific Instrument Company Records / Series 3: Engineering Department Records / 3.2: Dave Logan's Engineering Files
- Date
- 1975 - 1977
- Container
- Box 17, Folder 10
- Archival Repository
- Archives Center, National Museum of American History
- Type
- Archival materials
- Collection Citation
- Gerber Scientific Instrument Company Records, Archives Center, National Museum of American History, Smithsonian Institution.
- Collection Rights
- Collection items available for reproduction, but the Archives Center makes no guarantees concerning intellectual property rights. Archives Center cost-recovery and use fees may apply when requesting reproductions.
- Collection Restrictions
- Collection is open for research but is stored off-site and special arrangements must be made to work with it. Contact the Archives Center for information at archivescenter@si.edu or 202-633-3270.
- Record ID
- ebl-1503513430750-1503513430837-4
- Metadata Usage
- CC0